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Secs. 301, 304, 306, 307, 308, and 501 of the Clean Water Act (the Federal Water Pollution Control Act Amendments of 1972, as amended by the Clean Water Act of 1977, 33 U.S.C. 1311, 1314, 1316, 1317, 1318, and 1361; 86 Stat. 816, Pub. L. 92-500; 91 Stat. 1567, Pub. L. 95-217, unless otherwise noted.
48 FR 15394, Apr. 8, 1983, unless otherwise noted.
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The definitions in 40 CFR part 401 and the chemical analysis methods in 40 CFR part 136 apply to this subpart.
In addition,
(a) The term “total toxic organics (TTO)” means the sum of the concentrations for each of the following toxic organic compounds which is found in the discharge at a concentration greater than ten (10) micrograms per liter:
1,2,4 Trichlorobenzene chloroform
1,2 Dichlorobenzene
1,3, Dichlorobenzene
1,4, Dichlorobenzene ethylbenzene
1,1,1 Trichloroethane methylene chloride naphthalene
2 Nitrophenol phenol bis (2-ethylhexyl) phthalate tetrachloroethylene toluene trichloroethylene
2 Chlorophenol
2,4 Dichlorophenol
4 Nitrophenol pentachlorophenol di-n-butyl phthalate anthracene
1,2 Diphenylhydrazine isophorone butyl benzyl pthalate
1,1 Dichloroethylene
2,4,6 Trichlorophenol carbon tetrachloride
1,2 Dichloroethane
1,1,2 Trichloroethane dichlorobromomethane
(b) The term “semiconductors” means solid state electrical devices which perform functions such as information processing and display, power handling, and interconversion between light energy and electrical energy.
(c) The term “manufacture of semiconductors” means those processes, beginning with the use of crystal wafers, which lead to or are associated with the manufacture of semiconductor devices.
[48 FR 15394, Apr. 8, 1983, as amended at 48 FR 45250, Oct. 4, 1983]